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Flexible ALS/GC-LC/MS Instrument Control

Vector/Two features powerful interface electronics and software designed to control the operation of most popular mass spectrometers, allowing you to completely replace your existing data system while protecting your instrument investment. Vector/Two instrument control and acquisition is uniform across all instruments, allowing operators to move easily from a Finnigan INCOS50 to a HP 5988 without additional training. Standard instrument control features include :

Simplified automatic and manual instrument tuning
 
Vector/Two provides access to all available ion source, analyzer and detector parameters directly from the PC. To speed setup and ensure reproducibility, OMNITUNE software automatically tunes your mass spectrometer to PFTBA targets. Instrument parameters may also be adjusted interactively to meet your own set of optimal tuning conditions.
 
High dynamic range and scanning speed
 
Extended dynamic range (1:6553500) and scanning speed (1500 amu/sec) on Finnigan (INCOS 50, OWA, 4500, ...) and Extrel (ELQ400) instruments offers improved sensitivity in both scanning and single ion monitoring modes of acquisition.
 
Method development integrates all instrument parameters
 
Vector/Two's easy-to-use tabular and interactive parameter entry tables greatly simplify acquisition method development. All information regarding instrument setup (ALS,GC,MS) is saved in a single acquisition method file. In compliance with Good Automated Laboratory Practices (GALP), this information is also stored with each data file.
 
Extended device control and signal monitoring
 
Control miscellaneous devices, such as valves and sample diverters, via special relay and digital output lines provided with Vector/Two. Analog inputs channels may also be installed to monitor additional signals, such as temperature, pressure or UV signal. These signals are correlated in time with the mass spectral data for easy comparison of results.
 
Features List

Recent Enhancements

Instrument Control

Processing and Report Generation

Special Applications